The Institute of NANO Testing

【Invited Talk】

・Tsuyoshi Horikawa, Specially Appointed Proffesor, Department of Electrical and Electronic Engineering, School of Engineering, Institute of Science Tokyo, “Testing Challenges for Optoelectronic-Electronic Integrated Devices (Tentative)”

・Takaki Hatsui, Project Leader for Semiconductor Applications, RIKEN SPring-8 Center, RIKEN, “Toward Empowering the Semiconductor Industry with SPring-8”

【Tutorial】

・Osamu Ueda Visiting Researcher, Organization for the Strategic Coordination of Research and Intellectual Property, Meiji University, “Failure (Degradation) Analysis Techniques and Case Studies for Semiconductor Light-Emitting Devices”

【Evening Session】

Shunsuke Asahina, JEOL, ”Latest Trends in Overseas Semiconductor Failure Analysis Technology: Report on Participation in IPFA and ISTFA”